Rudolph Technologies Incorporated operates in the Process control instruments sector. Rudolph Technologies, Inc. is engaged in the design, development, and manufacture of process control defect inspection, metrology, and process control software systems used by microelectronics device manufacturers. The Company provides yield management solutions used in both wafer processing and final manufacturing through a family of standalone systems for macro-defect inspection, test systems, and transparent and opaque thin film measurements. It supports a range of applications in the areas of macro-defect detection and classification, diffusion, etch, lithography, chemical vapor deposition (CVD), physical vapor deposition (PVD) and chemical mechanical polishing (CMP). On August 11, 2010, the Company announced that it acquired selected assets of the Yield Dynamics software business from MKS Instruments, Inc (MKS Instruments). In our complete report available for purchase the company is compared to: FARO Technologies, Inc., Ixia and Cohu Inc.